5.16 Tystar16 - 16SDPLYA
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Tystar16 - 16SDPLYA
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Process Specification
Process Performance
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Tool Name:Tystar16
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Description: This monitor tracks polysilicon thickness and uniformity.
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Recipe:16SDPLYA
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Layer Material: Doped Polysilicon
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Targeted Results:
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TargetDescription
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Thickness [A]:1600Measured using nanoduv
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Non-uniformity [%]:<10Calculated using (MAX-MIN) / (MAX+MIN) method on thickness data.
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Process Conditions:
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Deposition:
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SiH4 [sccms]:120
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PH3 [sccms]:4
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Temperature [degrees C]:
615
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Time [min]:30
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QM Process Procedure:
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StepToolDescription
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Oxide WaferStock Wafer1k oxide stock wafer
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Flexus1flexusInitial stress measurement
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Oxide Depositiontystar2Deposition furnace
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FT1nanoduv5-point film thickness / index
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ellips
Refractive index
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Resistance Mapcde-resmap
5-point sheet resistance
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Backside etchtechnics-cClear backside
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Flexus2flexusFinal stress measurement
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FTIRftir
Molecular spectrum measurement
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Latest FTIR Measurement:09-06-2018
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