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Cyric irradiation課題番号9726
ATLAS実験用シリコン半導体位置検出器の放射線損傷試験(注3)
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15/07/13 20:06 改訂
2015/07/15-7/19
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Energy (MeV)70
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NIEL damage 1MeV-n/70MeV-p ratio0.7
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Particles (p/s/nA)6242000000
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Beam spot FWHM X [mm]8.0 sigma=3.40
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Beam spot FWHM Z (mm)9.4 sigma=3.98
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Scan speed (mm/s)2050
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Extra time/step (s)0.3333333333
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Number of scans20
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SCANScan1Scan2Scan3Scan4Scan5Scan6Scan7Scan8
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One sample coverage in X [mm]1103020224081220
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One sample coverage in Z [mm]95605244406620
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Number of samples in X11111111slotfirst run#last run#
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Number of samples in Z11111111112
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Sample offset X (mm)00000000299
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Sample offset Z (mm)0000-16.50-12-17.5311
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Beam scan X (mm)12444343654222634
2sigma overscan
488
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Beam scan Z (mm)11173686056222236
for 5% loss at the sample edge
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Beam area (mm^2)1376432122312216030244845721224677
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Scan start X (mm)-62-22-17-18-27-11-13-17722
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Scan start Z (mm)-55.5-36.5-34-30-44.5-11-23-35.5866
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Scan end X (mm)62221718271113179310
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Scan end Z (mm)55.536.5343011.511-10.51055
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Scan pitch X (mm)111111111133
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Scan pitch Z (mm)111736860562222361244
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Scan steps X124 44 34 36 54 22 26 34 131010
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Scan steps Z1 1 1 1 1 1 1 1 141111
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Scan time [s/round]638.2 354.9 257.3 243.6 343.8 65.3 77.1 148.5 1500
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20 rounds scan time [min]212.7 118.3 85.8 81.2 114.6 21.8 25.7 49.5
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20 rounds scan time [hhmmss]3h32m43s1h58m18s1h25m45s1h21m12s1h54m35s21m45s25m42s49m29s
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speed 50
speed 20
speed 20
speed 20
speed 20
speed 20
speed 20
speed 20
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=(B23/B19)/((B6*I23)/(E23*B5))
red=manual input
Completion
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run numberSetFluence (10^14 neq/cm^2)Al docimetry [1-MeV neq/cm^2]Scan Type Scan area [cm^2]Targets INTarget SCANCurrent@ Flange [nA]Current@ dump [nA]Current with targetYield factorBeam fractionN_neq [neq/cm^2/s]Est. Time [min]Est. Time [hhmmss]Loss Time [min]Replace with Real Clock time TIME(hh,mm,ss)real dTimeCommentsTemp (top) (°C)Temp (bottom) (°C)
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14:30:0041.2start data :2/25/2016
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Profile Low cur.712100.83 1.00
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Intermission655.04
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 Flange/Dump current ratio----0.8450704225
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Run start18:56:30N2 補充 40リットル　18:00頃startstopstartstop
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intermission0.00 0m0s18:56:300:00:00
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1Slot 1, 3, 5 (3e15 シールド+4chip)30Scan530.241,35670 6005800.90 1.00 1.7693E+11282.60 4h42m36s15.00 23:54:064:57:36stop : 19:01:30-19:16:302/25/201618:56:302/25/201623:54:062/25/16 18:562/25/16 23:54
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intermission46.92 46m54s0:41:000:46:542/25/201623:54:062/26/20160:41:002/25/16 23:542/26/16 0:41
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2Slot 1, 7 (3e15 シールド+4chip)30Scan530.2417670 6005800.90 1.00 1.7693E+11282.60 4h42m36s3.33 5:26:564:45:56stop : 3:15:10-3:18:30 Y軸 エラー2/26/20160:41:002/26/20165:26:562/26/16 0:412/26/16 5:26
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intermission44.07 44m4s6:11:000:44:042/26/20165:26:562/26/20166:11:002/26/16 5:262/26/16 6:11
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3Slot 9, 11 (1e15 シールド+1chip)30Scan812.24911800 6005700.75 1.00 4.3711E+11114.39 1h54m23s0.00 8:05:231:54:23OK2/26/20166:11:002/26/20168:05:232/26/16 6:112/26/16 8:05
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intermission9.62 9m37s8:15:000:09:372/26/20168:05:232/26/20168:15:002/26/16 8:052/26/16 8:15
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4Slot 12 (2e16)200Scan64.84-121400 120011900.86 1.00 2.2109E+12150.77 2h30m46s0.50 10:46:162:31:16stop : 8:36:26-8:36:562/26/20168:15:002/26/201610:46:162/26/16 8:152/26/16 10:46
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intermission25.23 25m14s11:11:300:25:142/26/201610:46:162/26/201611:11:302/26/16 10:462/26/16 11:11
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5Slot 10 (1e16)100Scan421.6-101400 120011900.86 1.00 4.9540E+11336.43 5h36m25s1.05 16:48:585:37:2810秒 stop at 11:45 & 13:02 &15:13 &15:30&16:22&16:312/26/201611:11:302/26/201616:48:582/26/16 11:112/26/16 16:48
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intermission7.63 7m38s20:55:004:06:02run6 の前にrun11を行った。2/26/201616:48:582/26/201620:55:002/26/16 16:482/26/16 20:55
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6Slot 8 (2e15)20Scan323.12-8900 8008000.89 1.00 3.0855E+11108.03 1h48m1s0.00 22:43:011:48:01上の温度にノイズが乗っている。ビームがないとノイズはない。バルブのコントロールを下の温度計を-20℃の設定に変えた2/26/201620:55:002/26/201622:43:012/26/16 20:552/26/16 22:43
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intermission24.98 24m59s23:08:000:24:592/26/201622:43:012/26/201623:08:002/26/16 22:432/26/16 23:08
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7Slot 6 (1e15)10Scan232.12-6600 5004830.83 1.00 1.3881E+11120.07 2h0m4s24.00 1:32:042:24:04stop : 0:08:00 - 0:32:00 窒素供給トラブル2/26/201623:08:002/27/20161:32:042/26/16 23:082/27/16 1:32
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intermission25.93 25m56s1:58:000:25:562/27/20161:32:042/27/20161:58:002/27/16 1:322/27/16 1:58
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8Slot 4 (1e14)1Scan232.12--458 52450.90 1.00 1.4436E+10115.45 1h55m27sX0.00 3:53:271:55:272/27/20161:58:002/27/20163:53:272/27/16 1:582/27/16 3:53
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intermission7.55 7m33s4:01:000:07:332/27/20163:53:272/27/20164:01:002/27/16 3:532/27/16 4:01
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9Slot 2 (1e13)0.1Scan232.12--26 5.44.70.93 1.00 1.4991E+09111.17 1h51m10sX0.00 5:52:101:51:102/27/20164:01:002/27/20165:52:102/27/16 4:012/27/16 5:52
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intermission10.00 10m0s6:02:100:10:002/27/20165:52:102/27/20166:02:102/27/16 5:522/27/16 6:02
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10Slot 9, 13 (1e15)10Scan75.72913370 3003000.81 1.00 4.6768E+1135.64 35m38s0.00 6:37:480:35:382/27/20166:02:102/27/20166:37:482/27/16 6:022/27/16 6:37
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intermission10.00 10m0s17:13:0010:35:122/26/20166:37:482/26/201617:13:002/26/16 6:372/26/16 17:13
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11Slot 14 (1e15)10Scan1137.64--141400 120012000.86 1.00 7.7743E+10214.38 3h34m22s0.00 20:47:223:34:222/26/201617:13:002/26/201620:47:222/26/16 17:132/26/16 20:47
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intermission0.00 0m0s20:47:220:00:002/26/201620:47:222/26/201620:47:222/25/16 20:472/26/16 20:47
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Cool down0.00 0m0s0.00 20:47:220:00:00
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Total2083.47 34h43m28s
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No. Shifts
Avail. (hr)
Tuning (hrs)
Work (hrs)
Irrad (min)
Irrad (hrs)
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Machine time448840
オペレータの方、ラン中はこの電流値をキープしてください。
2083.47 34h43m28s
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10Mrad=2x10^14 n/cm^2
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100krad=2x10^12 n/cm^2
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Current for 20 scans
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Example5Scan30.340.2 0.130.70 1.00 34094957982444.15 40h44m9s
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1) 32コースにビームが出ているときは、第３ターゲット室の入り口ドアを施錠
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2) 入室時、サーベイメータを使って空間線量を測定。1 uSv/hrをこえたらしばらく待つ。
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3) 照射した試料（特に、輸送を行う必要があるもの）は「非密封RI」、加速器使用簿（運転申込書）では「RI製造」に丸をつける。
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