ABCDEFGHIJKLMNOPQ
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Thickness, AIndex @632.8nmThickn. Uniformity, %CommentObservation
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MaxMinMinMax
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Datecenter of wafer
1cm from edge
center of wafer1cm from edgeThickness Uniformity, %
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10-08-182398.102335.901.9911.99598.69Film thicker in the center
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11-02-182298.222265.372.0032.00299.28Film thicker in the center
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Average2348.162300.641.9971.99998.98
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Avg.+2%2395.122346.652.0372.038
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Avg.-2%2301.202254.621.9571.959
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Max2398.102335.902.0032.00299.28
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Min2298.222265.371.9911.99598.69
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