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1. If you do not yet have a user account, see the "Become a user" page of the IMRI Website:NEMO – Become A User
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2. See the list below for the full range of instruments and techniques on which you may be trained. Click on links to take you to the training sign-up sheets for other instruments and facilities.
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3. To sign up for any individual training(s), go to the appropriate tab (the different tabs are located along the bottom of this spreadsheet) and fill out all relevant fields. More detailed descriptions are available on the tabs.
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4. See the "Billing & Rates" section of the IMRI website for details on training and usage costs:https://imri.uci.edu/information/rates/
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5. Once signed up, you will be contacted within several days to schedule your specific training sessions; users will be trained on a first-come, first-serve basis.
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InstrumentRoom/BuildingWebLinksBrief Descriptionib.ic
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FEI Magellan 400 XHR-SEM1302 Calit2FEI Magellan SEM Training Sign-Up Sheet.xlsxHigh Resolution SEM, EDS, STEM, Backscatter Imaging, E-Beam Lithography100.7518796992
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FEI Quanta3D SEM/FIB1302 Calit2FEI Quanta3D Training Sign-Up Sheet.xlsxSEM, Focused Ion Beam (FIB), EDS, Electron Backscatter Diffraction (EBSD), Backscatter imaging, TEM-prep w/Omniprobe 1
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Rigaku SmartLab/Ultima XRD1302 Calit2Rigaku XRD Training Sign-Up Sheet.xlsxPowder XRD with BB/PB optics, phase searchand m atch, thin Film out-of plane and inplane XRD, XRR, SAXS, HTXRD, microdiffraction and 2D area mapping
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Vibrometer1302 Calit2Vibrometer Training Sign-Up Sheet.xlsxMicro System Analyzer (Vibrometer): Measure in-plane and out-of-plane vibrations and surface topography of micro structures with sub-micrometer resolution
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Calit2 Sample Prep1302 Calit2Sample prep in Calit2.xlsxPlanar/GLAD film deposition and air/moisture sensitive film preparation and process
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Angstrom E-beam and Thermal Evaporator1301 Calit2https://docs.google.com/spreadsheets/d/14bmX4tf8wi4lkAJZ8giD7NiIkTKsdusr/edit#gid=772975663Planar/GLAD film deposition and air/moisture sensitive film preparation and process
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Nano-CTINRFVibrometer Training Sign-Up Sheet.xlsxX-ray Nano-Computed Tomography (Nano-CT): Non-destructively produce 3D images of objects with a resolution up to 850nm
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AFM Nano-RINRFhttps://docs.google.com/spreadsheets/d/1LF7P8l1_MWHutFSqZgfaG3Qt8SiKC8Hd/edit#gid=1510699660Atomic Force Microscopy (AFM): Quantitatively analyze the topography of your sample surface with resolution up to 2nm
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Kratos Supra XPS/UPS/SAM1322 Calit2Kratos Supra XPS.xlsx
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All Instruments @ TEMPR Lab2423 Calit2Training requestTEMPR Lab houses instruments for measuring materials thermal, elemental, mechanical, physical, and rheological properties.
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FEI/Philips CM-20 TEM140 Engineering Towerhttps://docs.google.com/spreadsheets/d/1RCt5q_yDmczxn9MmblJSq2XPZaaDi9GR/edit#gid=1913208381This is a tranditional 200 kV TEM with LiB6 filament capable of BF/DF/WB imaging and electron diffraction (ED). It allows a larg sample tilt ( primary tilt: 45 degree and 2nd tilt: 25 degree) which is useful to obtain ED at different zone axes . It is also equipped with EDS system for elemental analysis.
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FEI/Philips XL-30 SEM140 Engineering TowerFEI_Philips XL-30 SEM.xlsxThis is FEG SEM with a resolution of about 2nm. It equipped with BSE detector and new EDS for composition analysis.
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Hitachi 4300 SEM140B Engineering TowerHitachi 4300 SEM.xlsxThis is a Hitachi Regulus 8230 loaner system with many features such as cold FEG SEM, dual EDS, Inlens SE and BSE, retracable backscatter electron dectector (BSED). Ultra-high resolution imaging, excellent for low voltage imaging and composition analysis
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Anton Paar Tosca 400 AFM140b Engineering Towerhttps://docs.google.com/spreadsheets/d/1RT04pTU2HYk00GKkcoRWqn1PV_XLJWry/edit#gid=659549243This is loaner system from Anton Paar. Tosca 400 large sample table top AFM with Tapping mode and contact mode with force-distance capability. It is easy to operate and change scanning tips.
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MC2 Sample Prep140 Engineering TowerSample Prep in MC2.xlsxTEM, SEM, XRD, Sputter Coating, Electro- and Mechanical Polishing, Ion Milling, Core Drilling, Ion Milling, Optical Microscopy
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Tescan GAIA3 SEM/FIB1150 Engineering HallTescan GAIA3.xlsxSEM, Focused Ion Beam (FIB), EDS, Electron Backscatter Diffraction (EBSD), Backscatter electron dectector (BSED), TEM-prep w/Omniprobe, 3D-EDS, 3D-EBSD, EBIC
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JEOL JEM-2800 TEM1131D-1131E
Engineering Hall		JEOL2800 TEM.xlsx TEM, STEM, HRTEM, EDS, BF-DF-WB imaging
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JEOL JEM-2100 CryoTEM1131A-1131C
Engineering Hall		JEOL-2100F cryoTEM, CryoTEM, 3D Tomography, HRTEM, DF-WB imaging
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JEOL Grand ARM S/TEM1141A-1141C
Engineering Hall		GrandARM TEM, STEM, EDS etc
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CTEM Liquid N2 Handling1120 Engineering Hallhttps://docs.google.com/spreadsheets/d/1n6A1b9KwonmxHTqf84y00RbAgXMLaJkQ/edit#gid=1855445862all TEM users and those who use liquid nitrogen in sample prep room
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NION UltraSTEM1151A-1141C
Engineering Hall		Contact Toshi TEM, STEM, EDS etc
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CTEM Sample Prephttps://docs.google.com/spreadsheets/d/1YXCK9l5LJT6o37344QEL2VuFt3CnMqgc/edit#gid=905392152Fischione nanomill, LEICA sputter coaters, cryo-plunger, PIPS II
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CTEM Data Account Signuphttps://docs.google.com/spreadsheets/d/1Tsz5-U_HQw22STacJ-M4bhRqg3tCOC8Q/edit#gid=1453171578set up an account for data transfer
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Simpleware Softwarehttps://docs.google.com/spreadsheets/d/1T3U43pHY8YyxOzwF8SBWuzUocttu1qB9/edit#gid=1222273165Simpleware software can be used to process data for 3D reconstruction
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Request a Test for After Hours Accesshttps://docs.google.com/spreadsheets/d/13ybslIc5EZiR9FbZfK9f8Xuf1azqvrVn/edit#gid=1035852294Use instruments after hours (5pm - 9am) to gain access to a less crowded calendar and lower usage rates (8pm - 8am)
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***CLICK ON THE TABS BELOW, AT THE BOTTOM OF THE WINDOW, TO SIGN UP***
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*Homepage reorganized by Ezra Sarmiento 11/24
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