ABCDEFGHIJKLMNOPQR
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99.45911371
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Thickness, AIndex @632.8nmThickness Uniformity, %Comment
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MinMaxMinMax
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Datecenter of wafer1cm from edgecenter of wafer1cm from edgeThickness Uniformity, %
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12-09-142403.412378.211.9431.94499.47Thicker in the center
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12-23-142329.272341.321.9331.924Thinner in the center
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01-14-152307.932294.721.9391.93499.71Thicker in the center
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02-09-152327.772344.691.9371.932Thinner in the center
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02-23-152326.312301.281.9361.93799.46Thicker in the center
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04-06-151993.701879.761.9511.95497.06Thicker in the center
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04-17-152431.702317.111.9371.93997.59Thicker in the center
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05-11-152473.992465.451.9361.93799.83Thicker in the center
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05-13-152469.552415.011.9391.94198.88Thicker in the center
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05-28-152453.392447.171.9431.94399.87Thicker in the center
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06-15-152164.312152.381.9431.94699.72Thicker in the center
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10-02-152372.412475.581.9431.941Thinner in the center
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11-06-152091.542142.001.9521.950Thinner in the center
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11-10-152101.292155.061.9541.955Thinner in the center
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11-16-152160.842213.941.9471.947Thinner in the center
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11-18-152143.352165.691.9501.949Thinner in the center
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Average2284.422280.591.9431.94299.07
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Avg.+2%2330.112326.201.9811.981
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Avg-2%2238.732234.971.9041.903
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Max2473.992475.581.9541.95599.87
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Min1993.701879.761.9331.92497.06
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