ABCDEFGHIJKLMNOPQR
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100.1740373
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Thickness, AIndex @632.8nmThickness Uniformity, %Comment
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MinMaxMinMax
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Datecenter of wafer1cm from edgecenter of wafer1cm from edgeThickness Uniformity, %
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01-05-162320.122353.591.9391.938Thinner in the center
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02-11-162614.812595.781.9241.92399.63Thicker in the center
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03-18-162532.132498.721.9241.92599.34Thicker in the center
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03-24-162500.852509.571.9251.926Thinner in the center
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04-11-162518.232477.921.9381.93999.19Thicker in the center
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04-28-162521.482498.181.9451.93999.54Thicker in the center
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05-12-162369.302407.801.9371.937Thinner in the center
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05-24-162330.192341.471.9411.941Thinner in the center
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06-30-162222.262201.141.9441.94499.52Thicker in the center
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08-26-162231.002217.071.9491.95199.69Thicker in the center
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10-12-162321.842302.201.9481.94999.58Thicker in the center
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11-18-162213.902186.201.9631.96599.37Thicker in the center
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12-15-162351.382340.301.9491.95199.76Thicker in the center
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12-21-162321.172304.111.9391.94299.63Thicker in the center
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12-22-162321.592301.351.9381.93999.56Thicker in the center
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Average2379.352369.031.9401.94199.53
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Avg.+2%2426.942416.411.9791.979
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Avg-2%2331.762321.651.9011.902
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Max2614.812595.781.9631.96599.76
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Min2213.902186.201.9241.92399.19
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