ABCDEFGHIJKLMNOPQ
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Thickness, AIndex @632.8nm
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DateMinMaxMinMaxThickness Uniformity, %Comment
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center of wafer1cm from edgecenter of wafer1cm from edge
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01-09-2014204.98213.732.3682.37097.91Thicker in the center
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01-31-2014217.77223.362.3002.29998.73Thicker in the center
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03-19-2014196.94200.062.3592.36799.21Thicker in the center
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04-09-2014202.32205.532.3592.36499.21Thicker in the center
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04-29-2014222.53224.392.3202.33199.58Thicker in the center
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05-15-2014194.25199.292.3562.35698.72Thicker in the center
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06-09-2014203.68205.372.3272.33199.59Thicker in the center
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06-20-2014193.23189.462.3362.293Thicker in the center
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08-05-2014219.25226.042.3702.364Thinner in the center
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09-22-2014163.36168.342.0632.038Thinner in the center
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10-15-2014177.93179.802.0172.025Thinner in the center
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11-14-2014164.90171.142.0232.045Thinner in the center
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12-03-2014162.99167.892.1562.161Thinner in the center
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12-15-2014166.14167.732.0582.045Thinner in the center
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12-24-2014169.28171.692.1982.025Thinner in the center
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Average190.64194.252.242.2398.99
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Avg.+2%194.45198.142.292.27
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Avg-2%186.82190.372.202.18
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Max222.53226.042.372.3799.59
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Min162.99167.732.022.0297.91
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