ABCDEFGHIJKLMNOPQRSTUVWXYZ
1
UserFilmRecipeSubstrate TThicknessDep.timeJAW EC-400 (Woolam Spec. Ell.)Dep.rateStressBHF etch rate waferLPD ( light point defects)AVG dep.rateAVG+10%AVG-10%Avg indexAVG+1%AVG -1%AVG.StressAvg+30%Avg-30%Comments/Brian Lingg PM
2
3
1/1/2012UserSiO2SiO2_10250° C (Å)secIndex @ 632.8nmIndex @ 1550nm ( nm/min)(MPa) ( nm/min)before dep.after dep.Index @ 632.8nmDeposition done on 4"Si wafer
4
IndexDep.rateStressAvg.dep.rateAvg+10%Avg-10%Avg.IndexAvg+1%Avg-1%Avg.StressAvg+30%Avg-30%
5
01-06-14BiljanaSiO2SiO2_102501013.74176.61.4631.45934.44-401.73284105935.7439.3132.171.4611.4761.446-409.81-532.76-286.87Grouped particles
6
01-23-14BiljanaSiO2SiO2_102501069.74176.61.4561.44536.34-375.92604.2815929035.7439.3132.171.4611.4761.446-409.81-532.76-286.871/23/2014
7
02-03-14BiljanaSiO2SiO2_102501047.82176.61.4561.45135.60-346.54604.7130445135.7439.3132.171.4611.4761.446-409.81-532.76-286.87Film is much darker in the center
8
02-18-14BiljanaSiO2SiO2_102501031.00176.61.4541.44435.03-397.61545.754827435.7439.3132.171.4611.4761.446-409.81-532.76-286.872/14/14 Silane change
9
03-14-14BiljanaSiO2SiO2_102501053.21176.61.4551.44435.78-364.72600.9711222235.7439.3132.171.4611.4761.446-409.81-532.76-286.87Film darker in the center
10
04-08-14BiljanaSiO2SiO2_102501070.80176.61.4651.45436.38-460.47578.9335.7439.3132.171.4611.4761.446-409.81-532.76-286.87Film darker in the center
11
04-17-14BiljanaSiO2SiO2_102501035.09176.61.4641.45335.17-496.06547.7610321735.7439.3132.171.4611.4761.446-409.81-532.76-286.87Film darker in the center
12
05-05-14BiljanaSiO2SiO2_102501075.51176.61.4681.45736.54-462.66531.8035.7439.3132.171.4611.4761.446-409.81-532.76-286.87Film darker in the center
13
05-20-14BiljanaSiO2SiO2_102501066.69176.61.4541.44436.24-311.94863.8235.7439.3132.171.4611.4761.446-409.81-532.76-286.87Film darker in the center
14
06-04-14BiljanaSiO2SiO2_102501064.00176.61.4641.45936.15671.2035.7439.3132.171.4611.4761.446-409.81-532.76-286.87Stress data weird?
15
06-16-14BiljanaSiO2SiO2_10250989.33176.61.4561.44533.61-438.88903.22156235.7439.3132.171.4611.4761.446-409.81-532.76-286.87Wafer moved during deposition
16
08-01-14BiljanaSiO2SiO2_102501027.16176.61.4641.45334.90-500.68672.5435.7439.3132.171.4611.4761.446-409.81-532.76-286.877/31/2014
17
08-14-14BiljanaSiO2SiO2_10250995.80176.61.4631.45233.83-457.62692.453619235.7439.3132.171.4611.4761.446-409.81-532.76-286.87Film darker in the center
18
08-29-14BiljanaSiO2SiO2_102501004.45176.61.4561.44634.13-365.57575.5814192335.7439.3132.171.4611.4761.446-409.81-532.76-286.87A lot of small particles in the center
19
09-16-14BiljanaSiO2SiO2_102501007.15176.61.4621.45734.22-322.60525.8135.7439.3132.171.4611.4761.446-409.81-532.76-286.87used old wafer, not clean enough( dots after HF etch)
20
10-01-14BiljanaSiO2SiO2_102501043.66176.61.4701.45935.46-515.38671.08264109235.7439.3132.171.4611.4761.446-409.81-532.76-286.87A lot of particles! Why? PM?
21
10-15-14BiljanaSiO2SiO2_102501036.30176.61.4601.44935.21-415.82737.8535.7439.3132.171.4611.4761.446-409.81-532.76-286.8710/14/14 Silane change
22
11-06-14BiljanaSiO2SiO2_102501094.46176.61.4601.44937.18-396.71536.447323435.7439.3132.171.4611.4761.446-409.81-532.76-286.8710/23/2014
23
11-25-14BiljanaSiO2SiO2_102501137.09176.61.4631.45338.63-314.80545.1435.7439.3132.171.4611.4761.446-409.81-532.76-286.87
24
12-08-14BiljanaSiO2SiO2_102501090.44176.61.4641.45437.05-389.84589.4912943635.7439.3132.171.4611.4761.446-409.81-532.76-286.87
25
12-23-14BiljanaSiO2SiO2_102501137.40176.61.4641.45938.64-460.70540.5435.7439.3132.171.4611.4761.446-409.81-532.76-286.87
26
Avg.Thickness1051.94Avg Index1.4611.452
27
Index+1%1.4761.466
28
Index-1%1.4461.437
29
Avg Dep.Rate
35.74
30
Avg +10%39.31
31
Avg - 10%32.17
32
Avg. Stress-409.81
33
Avg +30%-532.76
34
Avg - 30%-286.87
35
Avg. HF e.r.626.97
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
51
52
53
54
55
56
57
58
59
60
61
62
63
64
65
66
67
68
69
70
71
72
73
74
75
76
77
78
79
80
81
82
83
84
85
86
87
88
89
90
91
92
93
94
95
96
97
98
99
100