ABCDEFGHIJKLMNOPQ
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Thickness, AIndex @632.8nm
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MinMaxMinMaxCommentBilja
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Datecenter of wafer1cm from edgecenter of wafer1cm from edgeThickness Uniformity, %
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9-Jan-2014617.69677.131.9551.97995.41Non-uniform film
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31-Jan-2014585.66672.701.9481.96293.08Non-uniform film
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19-Mar-2014662.23691.961.9982.00197.80Non-uniform film
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9-Apr-2014640.38675.211.9931.99897.35Non-uniform film
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29-Apr-2014625.27659.671.9631.98097.32Non-uniform film
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15-May-2014616.28657.861.9661.98696.74Non-uniform film
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9-Jun-2014599.87639.531.9761.98196.80Non-uniform film
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19-Jun-2014595.95641.831.9601.96996.29Non-uniform film
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29-Aug-2014521.30608.051.9411.95392.32IBD problems!New recipe!
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SeptemberDiscontinued taking SIN data!
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Average607.18658.221.9671.97995.90
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Avg.+2%619.32671.382.0062.018
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Avg-2%595.04645.051.9271.939
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Max662.23691.961.9982.00197.80
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Min521.30608.051.9411.95392.32
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