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Correlated Analysis with a �Nanomechanical Microscope

Ernest J. Fantner, Stefan Stadelbauer et.al.

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If you are interested in....

... investigating microstructured samples with high precision

Electrochemically plated copper sample

„deposited crystallites“

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Correlated Analysis with 2 systems: Nanoindenter & AFM

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Advantage:

  • Highest performance with each instrument
  • Wide choice of professional instruments

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Correlated Analysis with 2 systems: Nanoindenter & AFM

​

​

Advantage:

  • Highest performance with each instrument
  • Wide choice of professional instruments

​

Some obvious Problems:

  • How to position the indent with µm-accuracy at the Point of Interest identified with the AFM
  • Time consuming handling due to moving the sample back and forth between the two maschines (interactive operation mode is very difficult)

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The Nanomechanical Microscope

2 in 1

Integrate both instruments in ONE

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Our Nanomechanical Microscope for Interactive Correlated Analysis:

AFM scanner:

Lateral resolution: < 1 nm

Z-resolution: 1 nm

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Indenter:

Minimum force: 200µN

Force resolution: µN

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Stage:

positioning accuracy: 50nm

x,y movement: 2.5cm

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Enabling Technology: „all-electric cantilever“

USPs:

    • Displacement, phase and frequency measured by an integrated sensor �(“self-sensing-technology”)
        • No optical readout necessary (typically laser-beam-deflection)
    • Encapsulated electronics

- Fluid compatible

- Enable multifunctional coatings

      • fast dynamic response
      • high force sensitivity

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Let‘s demonstrate the advantages

High precision on difficult samples

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Electrochemically plated copper sample

„deposited crystallites“

​

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Let‘s demonstrate the advantages

High precision on difficult samples

​

Electrochemically plated copper sample

„deposited crystallites“

​

Looks like a crystal,

sharp edges, plane surfaces,...

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Let‘s demonstrate the advantages

High precision on difficult samples

​

Electrochemically plated copper sample

„deposited crystallites“

​

Looks like a crystal,

sharp edges, plane surfaces,...

What about the hardness?

  • Make an indent at the selected crystal

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Make your correlated analysis interactive....

Find first the most interesting place on the sample for your indent...

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Electrochemically plated copper sample: „deposited crystallites“

​

Analyse the force-distance performance and shape.

1

2

3

4

Make the indent at

selected crystal

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Let‘s demonstrate the advantages

Coupled techniques:

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100mN Indent with Berkovich tip

copper sample

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Get the force distance curve and combine with geometrical information from AFM

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Let‘s demonstrate the advantages

Coupled techniques:

​

100mN Indent with Berkovich tip

copper sample

​

Cumulative experiments:

​

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Add a 2.5 mN Indent

at a desired position

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Let‘s demonstrate the advantages

Coupled techniques:

​

100mN Indent with Berkovich tip

copper sample

​

Cumulative experiments:

​

​

Add a 2.5 mN Indent

at a desired position

​

Cumulate additional indents

to correlate indent performance with location on the sample

Possible applications: analyze strain hardening, grain boundaries, …

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High experimental freedom

Several precisely positioned indents with Berkovich tip on copper sample

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5 mN

2.5 mN

Possible application: microengraving -> nanoengraving, …

analyze or probe many sub-µm-structures

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Software - Navigator

a

c

b

g

AFM

Indent

i

a

ii

iii

iv

b

c

e

f

g

c

b

a

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Position your indents with micrometer precision....

Multi-layer organic solar cell:

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Sample: multi layer thin film solar cell stack

Investigation of hardness effects on solar cell efficiency

glass

ITO

layer4, 50nm

layer3, 100nm

layer2, 30nm

Ag, 100nm

PoI 2

PoI 1

2

1

1

2

…depending on your special sample

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Make your correlated analysis under non-ambient conditions..

Place the nanomechanical microscope in a glovebox!!!

Come here ☺

Set new standards:

Measure under

  • Argon
  • N2
  • forming gas
  • CO2
  • …

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The NanoMechanical Microscopy platform is a basis for new applications

New applications for the NanoMechanical Microscope

Nanoindentation

  • USP: Realtime correlated analysis
  • Nanomaterials
  • R&D laboratories

High pressure

  • USP: Sub-micron localized

GPa-pressure

  • Piezotronic materials
  • R&D Laboratories

Bio / cell research

  • USP: Correlated analysis in

non-ambient environment

  • Living cells
  • Bio-labs in R&D

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Combine your analysis method with our nanomechanical microscope.

.If your application would benefit from the synergies with an AFM...

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Think about combining your application with our AFM/SAM in 1 Instrument

    • Indenter, optical microscope, laser,...
    • Much larger samples acceptable than in a SEM
    • Real-time interactive correlated analysis
    • Time saving due to no sample moving between 2 instruments
    • Instrument location in the glovebox
    • A table top in an environmental chamber
    • ..

contact: ejf@c-sense.at

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Thank you!