Precision: microtesla (µT).
Lateral resolution: typically ~10–30 nm (limited by tip radius)
Magnetic Force Microscopy (MFM):
- A sharp tip coated with a magnetic material (commonly Co, Fe, or Ni) is scanned close to the sample surface.
- The tip experiences magnetic forces (attractive or repulsive) due to the stray fields from the sample.
- These forces cause a shift in the oscillation phase or frequency of the cantilever, which is detected and mapped.
- The Pt/Co interfaces provide the PMA and DMI necessary to stabilize the skyrmions and the spin orbit torque to move them with current
- The Ru thickness was optimized to achieve AF RKKY interlayer exchange coupling with a coupling field of m0H RKKY = 205 mT.
- The thickness of the Co layers was adjusted such that they were perpendicularly magnetized but close to the in-plane/out-of-plane spin reorientation transition, leading to a linear and reversible hysteresis loop indicating a multidomain state (Fig. 2B)