Chipmetrics' Metrology Workshop

This exclusive workshop provides opportunity to learn about Angstrom scale metrology of ALD thin films in ultra High Aspect Ratio structures. In addition, it gives insights of most advanced rapid analytical methods of ALD conformality.

This unique educational opportunity is being held in the fascinating venue in the lake district of Finland.

Workshop flyer and program can be downloaded from here:
Registration Fee: €650

Date: Thursday, 8th August 2024

Location: Vainoniemi villa, Joensuu, Finland

Contact us at +358 41 740 1098 or
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