Technical Seminar on Atom Probe Tomography for Atomic Scale Characterization Hosted by CAMECA Instruments

Seminar will be held in MRC 136 (Auditorium) on Nov 7th beginning at 11am. Lunch provided.

Technical Seminar on Atom Probe Tomography for 3D Atomic-Scale Characterization Hosted by CAMECA Instruments
Atom Probe Tomography (APT) is the highest special resolution analytical characterization technique with high efficiency single atom detection for quantitative atom scale 3D compositional analysis and elemental mapping of chemical heterogeneities. This talk will cover APT operational theory, an introduction to sample prep and data reconstruction, and an overview of various applications. A commercial cryo-UHV solution for FIB-APT specimen transfer will also be presented which expands the application space for APT to biological materials, hydrogen containing materials, and surfaces prone to rapid oxidation.
Email address *
LEAP 5000 and EIKOS instruments
First Name *
Your answer
Last Name *
Your answer
Title/Position *
Your answer
Department/Organization *
Your answer
Phone Number
Your answer
Submit
Never submit passwords through Google Forms.
This form was created inside of North Carolina State University. Report Abuse