Technical Seminar on Atom Probe Tomography for Atomic Scale Characterization Hosted by CAMECA Instruments
Seminar will be held in MRC 136 (Auditorium) on Nov 7th beginning at 11am. Lunch provided.
Technical Seminar on Atom Probe Tomography for 3D Atomic-Scale Characterization Hosted by CAMECA Instruments
Atom Probe Tomography (APT) is the highest special resolution analytical characterization technique with high efficiency single atom detection for quantitative atom scale 3D compositional analysis and elemental mapping of chemical heterogeneities. This talk will cover APT operational theory, an introduction to sample prep and data reconstruction, and an overview of various applications. A commercial cryo-UHV solution for FIB-APT specimen transfer will also be presented which expands the application space for APT to biological materials, hydrogen containing materials, and surfaces prone to rapid oxidation.
LEAP 5000 and EIKOS instruments
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