Bob Madge Innovation Award

Each year the Bob Madge Innovation awardee will be selected based on the nominee's Innovation, Impact, Collaboration and Dissemination of his/her contributions to the semiconductor industry.

    What is this award about?

    Remembering Bob Madge Bob was a long-time LSI and GLOBALFOUNDRIES employee. Bob died tragically in August 2014 in an aviation accident. Bob was the Senior Director of "Design To Mask" at GLOBALFOUNDRIES at the time of his death. Bob had a big impact on Semiconductor Testing, including major contributions in technical areas such as Adaptive Test, Yield Learning and Design-Process Co-Optimization. Bob was well-known in the industry for his openness in sharing ideas and information with others in the industry and for collaborating both with other companies and university researchers. The intent of this award is to recognize innovations in the broad areas of semiconductor design, test, data collection and data analysis that epitomize Bob’s passion for collaborative, disruptive innovation.

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