SIF Spring Workshop 2019: NEW USER DAY
NEW USER DAY - PARTICIPANT NOMINATION
Wednesday, May 22, 2019

Join us Wednesday, May 22 for an afternoon of SIF techniques and demonstration thrill rides!

Sessions will cover an overview of each of the four instruments located at SIF and their capabilities.

• SEM Teneo Fundamentals Thrill Ride: Sample preparation and navigation, detector overview, SEM imaging options (Lovac, Optiplan, STEM), Introduction to EDS and EBSD

• FIB-SEM Helios Fundamentals Thrill Ride: Navigation options, detector overview, SEM imaging, FIB imaging, FIB deposition and milling, and S/TEM Sample Preparation

• TEM Tecnai Fundamentals Thrill Ride: Light Element Imaging - Atomic resolution DPC and iDPC demonstrating light element imaging capabilities

• AC-TEM Titan Fundamentals Thrill Ride: Light Element Imaging - Atomic resolution DPC and iDPC demonstrating light element imaging capabilities


Space is limited for each of the demos, so please select the demo(s) that will be most beneficial to your project.

Those who are not yet users of SIF will be given priority. Workshop registration ends Sunday, May 12 and final participants will be notified May 15.

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