SIF Spring Workshop 2019: INTERMEDIATE USER DAY
INTERMEDIATE USER DAY
Thursday, May 23, 2019

Join us Thursday, May 23 for a morning of SIF techniques and demonstrations. Sessions will cover advanced techniques including Precession Electron Diffraction (PED), Focused Ion Beam (FIB) 3D Serial Sectioning, Atomic Leveling TEM Imaging, and Advanced EBSD.

8:00 - 10:00 am
• Advanced EBSD (SEM): This session will cover techniques for performing concurrent nano-scale mapping of structure and chemistry using advanced EBSD techniques, including Transmission Kikuchi Diffraction (TKD).

• Atomic Level Imaging (TEM): This session will discuss techniques for collecting concurrent chemical and atomic structural information at the scale of atoms.


10:20 am – 12:20 pm
• 3D Serial Sectioning (FIB): This session will cover fully 3D investigation and reconstruction of microstructure and chemistry down to the nanoscale.

• Precession Electron Diffraction (PED) (TEM): The Precession Electron Diffraction session will delve into the ability to do precise nanodiffraction, allowing mapping of crystallographic orientations, phase distributions and solution of complex crystal structures on grains as small as a few nanometers.


Those who are advanced SIF users will be given priority. Workshop registration ends Sunday, May 12 and final participants will be notified May 15.

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