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19ENG05 Nanowires - Stakeholder meeting - Questionnaire
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Please, indicate your affiliation.
Your answer
Which of the discussed Nanowires project activities was the most interesting for your applications?
WP 1 - High throughput nanodimensional characterisation of NWs
WP2: High throughput reliable nanoelectrical characterisation of NW solar cells
WP3: High throughput nanoelectromechanical measurement methods
WP4: Fast areal thermal imaging of NWs
Other:
Which, among the proposed nanowires systems, is the most interesting in your field of applications?
Porous silicon nanowires by MACE
Silicon nanowires by Deep RIE
GaN nanowires
ZnO nanowires
Silicon nanowires by VLS growth
Other:
Which, among the discussed characterization methods, could be applied to your activity?
Scatterometry
Atomic Force Microscopy
Scanning Thermal Microscopy
Conductive AFM
High-throughput AFM
Scanning Electron Microscopy
Cathodoluminescence
Other:
In the chosen applications, what metrology advancement (e.g. quantity to be measured) would be necessary? Optional
Your answer
Would you be interested in a measurement and/or calibration service for the same application?
Yes
No
Maybe
Clear selection
What are your procedures for evaluating metrology equipment for manufacturing?
Gauge Repeatability and Reproducibility (GR&R) studies
Rely on applications development by vendors
Establish uncertainty budgets
None of the previous choices
Comment on previous answer on metrology equipment.
Your answer
How often do you consult ISO standards?
Often
Rarely
Never
Clear selection
How often do you use Good Practice Guides developed by National Metrology Institutes?
Often
Rarely
Never
Clear selection
Do you rely on internally-developed written standards?
Yes
No
Maybe
Clear selection
Comment on previous answers on standards and good practice guides.
Your answer
How important is calibration and traceability to your manufacturing metrology framework? (1 not important, 5 very important)
1
2
3
4
5
Clear selection
How do you train your operators for metrology equipment? How important is ease of use? How could these factors be improved?
Your answer
What is your most critical unmet need when it comes to metrology equipment?
Your answer
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