Registration Form – Workshop Residual Stress Analysis Using XRD

We are pleased to invite you to join our upcoming workshop on advanced material characterization techniques for industrial applications.

This workshop, titled:

 “Residual Stress Analysis Using XRD: Supporting Material Testing and Failure Analysis”

will explore how X-ray diffraction (XRD) can be utilized for residual stress analysis, supporting accurate material testing and effective failure analysis. Participants will gain insights into how these techniques help identify stress distribution, detect potential material weaknesses, and improve product reliability.

The session will be delivered by Dr. Umesh Tiwari, who will share his expertise, practical approaches, and real-world applications of XRD in material evaluation.

📅 Session Details:

  • Topic: Residual Stress Analysis Using XRD: Supporting Material Testing and Failure Analysis
  • Date: Thursday, 21st May 2026
  • Speaker: Umesh Tiwari, Ph.D.
  • Location: Gedung Interdisciplinary Engineering (IDE) FTUI

Don’t miss this opportunity to enhance your understanding of advanced analytical techniques for material performance and failure investigation.

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