QuickEdit Release Notes
Added view with one row per part and test combination. Added logging message after each chart is drawn.
Fixed issue with displaying failed tests.
Allow the user to easily choose the tests with the highest percentage or count of failures or
lowest Cpk for analysis.
Allows the user to easier zoom to the limits or the natural range of the data in charts.
Automatically adding ATR record when bulk edits are made with QLC. Added ATR view.
Added views for PGR and WRR records.
Added angled labels to box plots so that long group names are readable.
Adds trend chart improvements including drift analysis.
Added option to trend charts to overlap groups.
Improved the ability to change tests assigned to PTR, FTR and MPR records. Added the ability to display GMT instead of local time for various date fields. Fixed a bug in the display of pass or fail for HBR and SBR records in the All Records view.
Updated license support.
Limits paretos to the top 20 entries to improve visibility.
Fixes a bug in exporting parametric data to JSL format.
This version resolves a problem reading STDF files from zip files and adds a default sanity limit to x and y values for wafer maps.
Fixes a bug when printing null unit values.
Fixes bugs in searching and grouped stats displays.
Fixed a bug in serializing groups in Trend Charts. Minor UI enhancements, including access to View submenus in popup menus.MrM
Added ability to combine different plot types in one window. Added tooltips and fixed text truncation bug in paretos.
includes a bug fix to histograms of parameters with negative values and charting performance improvements.
Fixed a bug in printing charts with 3 or more groups when using small points.
Made the notch on wafer maps more representative and removed performance problems caused when some wafers have invalid x/y values and others have valid ones.
Improved the speed and memory performance of histogram generation.
Fixed column sizing issue in File Summary.
Added optional bin-sublot-lot table to File Summary.
Fixed sanity limits-related bugs.
Added test conditions to grouping variable choices. Showing more flags for test result records.
Added grouping by lot and sublot to the bin-site view of File Summary.
Made smaller graph points optional. Made optional lot and sublot grouping on file summaries apply to total counts.
Fixed a bug in point ordering for trend charts.
Made graph points smaller.
Added yield trend chart.
Adds the ability to group file summaries by lot as well as sublot and head/site.
Added various options for configuring the number and width of histogram bins. Added options for formatting test results.
Added grouping to scatter plots.
Adds ability to select all tests in test selection dialog. Implements save all graphs to pdf.
Added normal probability plot. Added option to sort tests by test order instead of alphanumerically.
Fixed an error in standard deviation calculation (and derived statistics such as Cpk). Added optional connecting or regression lines to trend charts and scatter plots. Added the ability to read STDF files directly from scatter plots.
Adds mouse-over point descriptions for trend charts. Adds optional use of sanity limits to remove outliers.
Changed trend charts to display groups sequentially, unless grouping by test. Fixed Lot Summary export to not show html tags. Added option to display groups on separate trend charts.
Added scatter plots.
Added box plots. Added ability to include multiple tests in one trend chart. Removed bugs found when combining files in a Lot Summary report. Improved behavior of always merge files option.
Added view with statistics for all tests. Removed need to recreate summaries to properly populate lot report. Added various small bug fixes.
Added pass-fail wafer maps and test failure paretos.
Added trend charts and histograms for test parameters.
Various small bug fixes.
Added drag and drop of files into QE. Added restore and reverse of original sort to table views.
Added WCR view. Added variance and standard deviation to statistical summaries. Fixed bug in sorting test columns on Parametric Results when limits are exposed.
Added basic statistical summaries (means, median) to tests.
Integrated MPR data into Parametric Results by default by making one column for each test/pin combination.
Fixed bugs related to Close menu.
Separated QE Basic and Pro. Enhanced all items view. Fixed bug in column resizing. Added auto-opening of file open dialog in QE Basic.
Enabled viewing of first result for an MPR in parametric results, with option set. Fixed synchronization bug related recreating summary records.
Fixed error in test summarization causes by results with invalid test/fail flag set.
Fixed dependency problem for Excel output.
Improved handling of test numbers that hold several names by treating upper and lower case names that are otherwise the same as being equal.
Tuned memory utilization.
Added Excel output format.
Fixed problem with FTR values in ParametricResults report.
Added an option to have multiple tests with the same number.
Fixed missing data when multiple lots are loaded together.
Added stacked bin map.
Improved merging of files.
Added Lot Tree view.
Reduced memory footprint of DTRs when not using test conditions
Reduced memory used in recreating summaries. Identifying situations where summaries should not be regenerated. Added configurable option to regenerate
summaries by default.
Added file association on Mac OS X and various small fixes.
Added key PTR flags to UI.
Improved editing of STDF records.
Fixed bug in recreating summary records.
Started resetting test condition state to default when a PIR is seen.
Added fixes to unusual configurations of PIR records.
Added list of failed tests to Part Results table.
Add options controlling which PMR fields are used to describe pins in the Multiple Results by Test view.
Reduce of STR cache to reduce memory footprint of very large STDF files.
Improves caching of STR records. It also improves handling of very large STDF files.
Added reading of test conditions from properly formatted DTR records. Fixed bug in handling of files with leading corrupt bytes that resemble real STDF records.
Fixes a bug encountered when generating placeholder parts. Enables changing of file description field in Results by Test view. Enables clearing of the recent files list.
Enabled adding of file description field.
Adds handling for the new STDF Pattern Sequence Record.
Add Test Fail % view for all wafers of a lot, if they are in data store. Fixed bug in test execution counts in Lot Summary report. Saving choice of windows opened, so the same windows open for the next file opened.
Fixed MPR save bug--last two fields were not saving. Fixed bug with save all fields option.
Fixed bugs in saving of certain data records. Improved display of FTR and MPR records
Fixed a bug in reading of zero-length DTR records.
Added error handling to use of new Java library for buffer processing to fix errors that caused loading errors in 1.8.40.
Added ability to detect missing parts and simulating them.
Added ability to jump to Data File Records from Part Results.
Enabled license registration directly from QuickEdit
Fixed bug on Linux from search library exception causing files to not load.
Fixed problem with deleting multiple records and data model not rebuilding properly.
Fixed problem with zeroing bin counts when recreating summary records.
Add warning when STDF has multiple MIR records
Do not use second MIR record
Improved Lot Summary labels.
Dropped end time from known files dialog
Change bin column headers in Lot Summary to indicate Hard Bin or Soft Bin
Enable Lot Summary to be for whole lot or by head/Site.
Changed a few labels in Lot Summary header.
Improved column spacing in Lot Summary test failure table.
Widened QuickEdit windows.
Improvements to find, including eliminating multiple find windows for same STDF and adding ability to search backward
Add ability to search for column names
Add ability to sort by multiple columns
Add MacOS build as part of standard release process
Internal use only
Add lot summary report as part of STDF load process