INTERFEROMETRIC SYSTEMS AND IMAGING |
Main lecturer Mail address Phone number | Jihad ZALLAT, Title jihad.zallat@unistra.fr, office B 257, +33 (0)3 68 85 45 14 | |
Other instructor(s) | “N/A” if none, “Firstname Name” otherwise. |
APOGEE code Track - Year - Option - Semester Coefficient = ECTS Duration | EP013M48 Engineer - 3Y G Photo - S9 Master - 2Y MPhot - S3 2 / 3 21h CM |
EXAMS Duration Authorized documents If yes, which ones : School calculator authorized | Session 1 CT 1h45 / Continuous test / Research homework No No | Session 2 Oral 30 min Yes / No Yes / No |
Prerequisites Prerequisites of this lecture are ... | ||
Lecture goals This course teaches the experimental methods in optical metrology based on the intrinsic properties of the light (intensity, coherence, polarization). | ||
Detailed outline Rationale : Waves and beams How to measure the phase, the polarization, the wavelength Lasers and sources Interferometry : Coherency, interferences. Diffraction : Imaging in the real and Fourier spaces Optical components for metrology: Mechanical elements, different kind of modulators Holography: Principle, measuring dimensions, distances, displacement, speed, etc. Speckle metrology: Speckle, characterization, speckle figures, measuring displacement and speed, speckle filtering, speckle interferometry. Interferometric microscopy. | ||
Applications Systems modelling with MATLAB | ||
Acquired skills The student will be able to understand and use the intrinsic light properties to design and study a specific interferometric imaging system. |